Erratum to“Accurate determination of film thickness by low-angle x-ray reflection”
2022-09-24 08:04:30MingXu徐明TaoYang楊濤WenxueYu于文學NingYang楊寧CuixiuLiu劉翠秀ZhenhongMai麥振洪WuyanLai賴武彥andKunTao陶琨
Chinese Physics B 2022年9期
Ming Xu(徐明) Tao Yang(楊濤) Wenxue Yu(于文學) Ning Yang(楊寧)Cuixiu Liu(劉翠秀) Zhenhong Mai(麥振洪) Wuyan Lai(賴武彥) and Kun Tao(陶琨)
1Institute of Physics&Center for Condensed Matter Physics,Chinese Academy of Sciences,Beijing 100080,China
2Department of Materials Science,Jilin University,Changchun 130023,China
3Department of Materials Science,Tsinghua University,Beijing 100083,China
Keywords: erratum,film thickness,x-ray
In II.optical theory of film,[1]Eq.(6)should be
All subsequent derivations were given based on the correct Eq.(6),so the conclusions in the paper[1]are not affected by the errata.
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